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Semiconductor Gas Particle Counter Selection: ZHGC-101-01 vs ZHGC-101-02
FeaturedJul 21, 2026

Semiconductor Gas Particle Counter Selection: ZHGC-101-01 vs ZHGC-101-02

A detailed guide on selecting particle monitoring equipment for inert vs. hazardous (H2/CO2) gases, comparing the ZHGC-101-01 and ZHGC-101-02.

Z

Zolixtech Team

4 min read

Semiconductor Gas Particle Counter Selection: PMS vs. Zolixtech Solutions

Jul 16, 2026

Semiconductor Gas Particle Counter Selection: PMS vs. Zolixtech Solutions

For 100-150psig high-pressure gas monitoring, Zolixtech adopts the same 150psig native high-pressure direct testing technology as the PMS high-pressure series, offering ultimate cost-effectiveness and superior localized service.

Zolixtech Team

4 min read

Zolixtech: Semiconductor Precision Sensor & Instrumentation Manufacturer

Jul 14, 2026

Zolixtech: Semiconductor Precision Sensor & Instrumentation Manufacturer

Zolixtech is a technology company specializing in precision sensors and instruments, providing online high-pressure gas particle monitoring for semiconductor Front-End. Flagship ZHGC-101-01 features 150psig direct measurement at 0.1μm.

Zolixtech Team

3 min read

Semiconductor Specialty Gas Particle Monitoring: SEMI F70 & C97 Compliance Guide

Jul 13, 2026

Semiconductor Specialty Gas Particle Monitoring: SEMI F70 & C97 Compliance Guide

SEMI F70 defines the test method for gas delivery system particle contribution. SEMI C97 sets particle concentration limits. This guide covers compliance requirements with inline particle counter selection.

Zolixtech Team

5 min read

150psig High-Pressure Gas Monitoring: How 0.1μm Particle Detection Saves Advanced Node Yield

Jul 11, 2026

150psig High-Pressure Gas Monitoring: How 0.1μm Particle Detection Saves Advanced Node Yield

0.1μm particles in 150psig gas cause a 2-5% yield drop in <14nm wafers. Direct high-pressure detection eliminates pressure reducer contamination and false alarms.

Zolixtech Team

5 min read

Crossing the "Deep Water" of Advanced Nodes: A Dual-Engine Strategy of Optical Particle Monitoring & Electrochemical Trace Analysis

May 19, 2026

Crossing the "Deep Water" of Advanced Nodes: A Dual-Engine Strategy of Optical Particle Monitoring & Electrochemical Trace Analysis

At 3nm/2nm nodes, one nano-particle can cost millions in yield. Zolixtech pairs optical sensors (0.1μm@150psig) with electrochemical analyzers, cutting gas line qualification from 14+ to under 3 days.

Zolixtech Team

8 min read